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Beilstein J. Nanotechnol. 2018, 9, 1220–1227, doi:10.3762/bjnano.9.113
Figure 1: (a) Scanning electron micrograph of a FEBID pad. (b) Atomic force micrograph of the same pad. (c + ...
Figure 2: (a) Raman spectra of a FEBID pad, FEBID precursor and the substrate. The complex structure of the p...
Figure 3: (a) Real and (b) imaginary part of the dielectric function of the measured FEBID material, averaged...
Figure 4: (a + b) Scanning electron micrographs of a single nanopillar (a) and a copper helix with three pitc...
Figure 5: (a) Array of 8 × 8 nanocones with a distance of 400 nm, base diameter of 80 nm and a height of 250 ...
Beilstein J. Nanotechnol. 2018, 9, 224–232, doi:10.3762/bjnano.9.24
Figure 1: Scanning electron micrographs of deposits from AgO2CC2F5 on bulk 200 nm SiO2/Si using a 25 keV/0.25...
Figure 2: SEM images of box deposits with the same electron dose of 7.44 nC/µm2 but different dwell and refre...
Figure 3: Images of a line deposit on a carbon membrane. (a) Scanning electron micrograph of the line deposit...
Figure 4: Dark field scanning transmission electron micrographs of the line deposit. (a) Overview image of th...
Figure 5: LineTV: FEBID line connecting four gold electrodes for four point probe measurements on bulk SiO2/S...
Figure 6: Transmission electron micrographs of the carbon membrane after deposition. (a) Typical dark field S...